![]() The compactness and ultrathin nature of the spectrometer render this technology very attractive for potential applications in on-chip integrated photonics where spectral analysis and information processing can be performed in a compact platform. The uniqueness of this technique lies in the novel lens design that can simultaneously realize wavelength splitting and light focusing. They have developed an ultra-thin spectrometer with a nanometer resolution by controlling the dispersion using a single metasurface device, which was designed based on a novel lens model. Xianzhong Chen from Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, UK, have proposed a new method for dispersion control. In a paper published in Light: Science & Applications, a team of researchers, led by Prof. To meet the requirement of system integration, there is a pressing need for a compact, simple, and efficient approach to realize a high-resolution spectrometer. The combination of such free-space optical elements along with the free-space propagation volume result in bulky spectrometers, which are incompatible with on-chip integration technology. Dispersive optical elements (e.g., a diffraction grating or a prism) are the key components of the conventional spectrometer used to achieve the desired dispersion.ĭispersion originates from the variation of the material's refractive index with the wavelength of the incident light beam. These devices have found a wide range of practical applications. Credit: Ruoxing Wang, Muhammad Afnan Ansari, Hammad Ahmed, Yan Li, Wenfeng Cai, Yanjun Liu, Songtao Li, Jianlong Liu, Li Li, and Xianzhong ChenĪn optical spectrometer is an instrument used to measure properties of light over a specific portion of the light spectrum. By analyzing the normalized intensities on the ring, five central wavelengths of the polychromatic incident light beam are obtained (right panel). c, Field distribution on the focal plane under the illumination of polychromatic incident light beam (left panel). b, Field distributions on the focal plane under the illumination of monochromatic incident light beams with different wavelengths. A, A schematic diagram of the proposed metasurface spectrometer based on wavelength dependent multi-foci metalens model.
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